FIP-BM30A is the French ESRF beamline for protein crystallography. FIP-BM30A can be used either for normal diffraction or for multiwavelength diffraction, using anomalous dispersion (SAD, MAD experiments. Its optics delivers a focused beam on a fixed sample position, with an energy resolution of about 10-3 to 10-4 and a large accessible energy range (7-18 keV). The beam intensity is 0.5.1011 photons/(0.3x0.3 mm2) for 2.10-4 energy resolution at 12.5 keV. FIP-BM30A is an highly automated beamline, with a unique robotized experiment setup. Apart from the robotized sample changer, FIP is equipped with a crystallisation plate screening system (G-Rob) for direct in situ analysis of crystals in the X-ray beam. With this system, it is possible to analyze crystals in sitting drop crystallization plates or microchips. This is specifically interesting for crystals that are too small to be fished or too fragile to be handled or frozen. This equipment allows a rapid screening to determine the nature of the object to be analyzed (salt, protein crystal), to collect few frames for cell determination or even full diffraction data collection. This system is available to all FIP users, either during their standard allocated time or in a rapid access mode
Jean-Luc Ferrer (Phone: 04-38-78-59-10)
Franck Borel - Philippe Charrault - Jean-Luc Ferrer - Pascale Israel-Gouy - Jacques Joly - Michel Pirocch
David Cobessi - Jerome Dupuy - Gavin Fox - Christine Gaboriaud - Eric Girard - Thomas Iwema - Richard Kahn - Jean-Baptiste Reiser
Location: FIP-BM30A is located at the ESRF, on bending magnet #30
Access mode: FIP-BM30A beamline is accessible to:
French academical users, through a national program comity,
European academical users, through the ESRF program comity,
Industrial users (direct access, no selection process, in the limit of a 10% quota).
Costs for PSB users: free for academic users.
Reference and minimum acknowledgement text (grant numbers?) for publications: Please, cite the following reference: M. Roth, P. Carpentier, O. Kaïkati, J. Joly, P. Charrault, M. Pirocchi, R. Kahn, E. Fanchon, L. Jacquamet, F. Borel, A. Bertoni, P. Israel-Gouy, and J.-L. Ferrer, "FIP: a Highly Automated Beamline for Multiwavelength Anomalous Diffraction Experiments", Acta. Cryst. D58 (2002), 805-814.